NVM-e SSD Evaluations for Burst Buffers (2016 - 2017)

Mar 1, 2017 · 1 min read
Technology Integration Group, Oak Ridge National Laboratory, USA
Research Intern, Post-doc, Research Associate, March 2016 ~ June 2017

Overview

Evaluate NVM-e SSDs from multiple vendors (Intel, Samsung & HGST) to understand the impact on our systems when employed as a component (i.e., burst buffer) within an HPC multi-tiered storage environment.

  • Develop specialized I/O benchmarks that can reveal true I/O characteristics Flash based SSDs.
  • Carried out evaluations and deep analysis of the write capabilities of various NVM-e SSDs.
  • Delviered results helping OLCF to determine its SSDs for node local NVRAM for the Summit Supercomputer.

Technology

  • fio fio - Flexible I/O tester
  • 1st and 2nd generation NVM-e SSDs (PCI-e Gen3) from various vendors
  • Python-based custom benchmark driver & analysis

Media Coverage